EC4230 Reliability Issues for Military Electronics

This course investigates where and why semiconductor devices fail in military environments. Topics include limitations of commercial-off-the-shelf (COTS) integrated circuits, thermal failure, electrostatic breakdown, noise in solid state devices, packaging reliability issues, radiation effects due to space and nuclear environments, and the limited availability of military integrated circuit suppliers.

Prerequisite

EC3220

Lecture Hours

3

Lab Hours

2

Course Learning Outcomes

1. Understanding of semiconductor device physics of failure mechanisms.
2. Recognize statistical distributions of failures in time.
3. Develop knowledge of how radiation can degrade electronics.
4. To know relevant military specifications for DoD electronic requirements.