PHYS 310 Imaging of Materials
Introduces the theory and operation of the scanning electron microscope (SEM) and the atomic force microscope (AFM). Requires student-designed research project, including scientific literature review and laboratory use of the SEM or AFM to solve the defined problem. Results are presented in a final written report and a poster presentation. Three hours of lecture and a three-hour lab per week for half the semester.
Prerequisite
PHYS 115